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Optical absorption and electrical conductivity in amorphous Ge/SiOx superlattices

โœ Scribed by A. Bittar; G.V.M. Williams; H.J. Trodahl


Book ID
103893663
Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
342 KB
Volume
157
Category
Article
ISSN
0378-4371

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โœฆ Synopsis


We have produced high quality amorphous Ge/SiO, superlattice films with periods ranging from 2 to 30 nm. Normal incidence optical spectroscopy is used to determine the effectivemedium absorption edge, identical in this geometry to the interband edge in the narrow band gap layers (Ge). The edge shows a blue shift associated with quantum confinement in Ge layers thinner than 5 nm. A simple Kronig-Penney model fits the results if we assume conduction-and valence-band edge discontinuities of 1.1 and 0.3eV, respectively. DC conductivity measurements parallel to the layers show the effects of 2D confinement on hopping conductivity.


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