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[Opt. Soc. America Technical Digest Summaries of papers presented at the International Quantum Electronics Conference Conference Edition. 1998 Technical Digest Series, Vol.7 - San Francisco, CA, USA (3-8 May 1998)] Technical Digest. Summaries of Papers Presented at the International Quantum Electronics Conference. Conference Edition. 1998 Technical Digest Series, Vol.7 (IEEE Cat. No.98CH36236) - Resonant van der Waals repulsion between free excited atom and dielectric surface: an experimental signature

✍ Scribed by Failache, H.; Fichlet, M.; Saltiel, S.; Bloch, D.; Ducloy, M.

Book ID: 115512968
Publisher: Opt. Soc. America
Year: 1998
Tongue: English
Weight: 171 KB
Volume: 0
Category: Article
ISBN-13: 9781557525413
DOI: 10.1109/iqec.1998.680329

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