Application of XΜ control chart with mod
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T. C. Chang; F. F. Gan
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Article
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1999
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John Wiley and Sons
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English
β 112 KB
The conventional Shewhart X chart is developed based on the assumption that the within-sample variation is due to the inherent process variation, and any significant variation between samples is attributed to the existence of assignable causes. In the manufacturing industry there are processes where