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Open-structure resonant technique for measuring the dielectric properties of materials

✍ Scribed by Humbert, W.R.; Scott, W.R., Jr.

Book ID: 114544071
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 223 KB
Volume: 47
Category: Article
ISSN: 0018-9456
DOI: 10.1109/19.744321

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