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Open-ended coaxial probe for high-temperature and broad-band dielectric measurements

✍ Scribed by Gershon, D.L.; Calame, J.P.; Carmel, Y.; Antonsen, T.M.; Hutcheon, R.M.

Book ID: 111875632
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 228 KB
Volume: 47
Category: Article
ISSN: 0018-9480
DOI: 10.1109/22.788604

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