A quick estimation of the thickness of thin films deposited on glass plates is described in this paper. The principle of the method is based on the measurement of the Haidinger fringes generated by the film. For ease of observation and measurement, a commercial Fizeau-type interferometer such as a Z
β¦ LIBER β¦
One-dimensional diffuser based on a thick layer of dichromated gelatin
β Scribed by N. M. Ganzherli; Yu. N. Denisyuk; I. A. Maurer
- Book ID
- 110137225
- Publisher
- SP MAIK Nauka/Interperiodica
- Year
- 2003
- Tongue
- English
- Weight
- 30 KB
- Volume
- 29
- Category
- Article
- ISSN
- 1063-7850
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
Non-destructive thickness measurement of
β
R.P. Shukla; D.V. Udupa; N.C. Das; Murty V. Mantravadi
π
Article
π
2006
π
Elsevier Science
π
English
β 655 KB
Determination of diffusion layer thickne
β
Chen, Guang Hao ;Huang, JuβChang
π
Article
π
1996
π
Informa UK (Taylor & Francis)
π
English
β 604 KB
Estimation of Gelatin Layer Thickness on
β
Y. Ngothai; S.N. Bhattacharya; I.H. Coopes
π
Article
π
1997
π
Elsevier Science
π
English
β 92 KB
ARTICLE NO. CS975029 NOTE Estimation of Gelatin Layer Thickness on Polystyrene Particles by a Viscometric Study tion (9), and viscometric techniques. Ellipsometry (8) has been used to determine the thickness of the adsorbed layer of simple homopolymers but A viscometric method has been used to deter
Determination of gelatin-layer thickness
β
H Coll; L.E Oppenheimer; C.G Searles
π
Article
π
1985
π
Elsevier Science
π
English
β 789 KB
Dependence of angular selectivity of thi
β
R. Ranjan; Abhijit Ghosh; H. L. Yadav
π
Article
π
2012
π
Springer-Verlag
π
English
β 378 KB
Effect of laser annealing on the dynamic
β
A. V. Neupokoyeva; A. N. Malov; S. N. Malov
π
Article
π
2009
π
Springer
π
English
β 416 KB