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On-wafer microwave measurement setup for investigations on HEMTs and high-Tc superconductors at cryogenic temperatures down to 20 K

✍ Scribed by Meschede, H.; Reuter, R.; Albers, J.; Kraus, J.; Peters, D.; Brockerhoff, W.; Tegude, F.-J.; Bode, M.; Schubert, J.; Zander, W.


Book ID
114551290
Publisher
IEEE
Year
1992
Tongue
English
Weight
962 KB
Volume
40
Category
Article
ISSN
0018-9480

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