On-wafer calibration of a double six-port reflectometer including constants for absolute power measurements

✍ Scribed by Berghoff, G.; Bergeault, E.; Huyart, B.; Jallet, L.

• Book ID: 114543922
• Publisher: IEEE
• Year: 1997
• Tongue: English
• Weight: 496 KB
• Volume: 46
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/19.676722