On the use of random limited-scan to improve at-speed random pattern testing of scan circuits

✍ Scribed by Pomeranz, I.

• Book ID: 118698287
• Publisher: IEEE
• Year: 2002
• Tongue: English
• Weight: 427 KB
• Volume: 21
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/tcad.2002.801092