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On the triggering mechanism for the metal–insulator transition in thin film VO2devices: electric field versus thermal effects

✍ Scribed by Gokul Gopalakrishnan; Dmitry Ruzmetov; Shriram Ramanathan


Book ID
106394807
Publisher
Springer
Year
2009
Tongue
English
Weight
381 KB
Volume
44
Category
Article
ISSN
0022-2461

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