On the theory of anodic levelling: FEM simulation of the influence of profile shape and cell geometry

✍ Scribed by C. Clerc; D. Landolt

• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 754 KB
• Volume: 29
• Category: Article
• ISSN: 0013-4686
• DOI: 10.1016/0013-4686(84)80015-8

✦ Synopsis

The Finite Element Method (FEM) has been applied to study the influence of profile shape and cell geometry on the rate of anodic levelling under conditions of negligible electrode polarization. The precision of the numerical computations is assessed by comparison with analytical solutions for limiting cases. It is shown that at intermediate cell geometries the rate of levelling of triangular and sinusoidal profiles depends on two dimensionless parameters expressing the ratio of profile height to profile wavelength and to interelectrodedistanoe, respectively. Levelling of spaced grooves or recesses is slower than levelling of regular sinusoidal or triangular profiles of similar geometry.