On the term “activation energy” in accelerated lifetime tests of plastic encapsulated semiconductor components: A. Moeller. Microelectron. Reliab. 20, 651 (1980)

• Publisher: Elsevier Science
• Year: 1981
• Tongue: English
• Weight: 122 KB
• Volume: 21
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(81)90271-7