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On the Switching Parameter Variation of Metal Oxide RRAM—Part II: Model Corroboration and Device Design Strategy

✍ Scribed by Shimeng Yu; Ximeng Guan; Wong, H.-S.P.


Book ID
114620892
Publisher
IEEE
Year
2012
Tongue
English
Weight
998 KB
Volume
59
Category
Article
ISSN
0018-9383

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