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On the segregation of the conductive phase in RuO2-based thick resistive films

โœ Scribed by Andrzej Szpytma; Andrzej Kusy

Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
556 KB
Volume
121
Category
Article
ISSN
0040-6090

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๐Ÿ“œ SIMILAR VOLUMES

Fracture resistance evaluation of RuO2-b
Fracture resistance evaluation of RuO2-based thick film resistor material by in situ crack extension observation in a scanning electron microscope
โœ Niko Sebastian Dorsch; Ilya Peshekhodov; Philipp Spies; Gerold A. Schneider ๐Ÿ“‚ Article ๐Ÿ“… 2008 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 663 KB

Parameters for the fracture mechanics of thick film materials are scarce in the literature. One reason is that for many such materials it is very difficult to produce a bulk specimen as required for most standard tests. This paper describes an alternative method for measuring the fracture resistance