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On the Reliability of a Worst Case Designed Nonredundant Circuit

โœ Scribed by Combs, C. A.


Book ID
114667601
Publisher
IEEE
Year
1963
Tongue
English
Weight
427 KB
Volume
R-12
Category
Article
ISSN
0018-9529

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On the Design of Reliable Boolean Circui
โœ Dan Kleitman; Tom Leighton; Yuan Ma ๐Ÿ“‚ Article ๐Ÿ“… 1997 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 392 KB

We investigate a model of gate failure for Boolean circuits in which a faulty gate is restricted to output one of its input values. For some types of gates, the model, which we call the short-circuit model of gate failure, is weaker than the traditional von Neumann model in which faulty gates always