On the relationship between the bulk recombination lifetime and the excess 1f noise in silicon p-n junction diodes

✍ Scribed by E Simoen; J Vanhellemont; C Claeys

• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 320 KB
• Volume: 98
• Category: Article
• ISSN: 0038-1098
• DOI: 10.1016/0038-1098(96)00186-x