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On the question of the uniqueness of determining defect parameters in semiconductors on the basis of an analysis of the temperature dependence of the hall charge carrier concentration by using an electronic computer

✍ Scribed by M. A. Krivov; E. A. Popova; E. V. Malisova

Book ID: 112425765
Publisher: Springer
Year: 1973
Tongue: English
Weight: 261 KB
Volume: 16
Category: Article
ISSN: 1573-9228
DOI: 10.1007/bf00891536

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