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On the origin of leakage current reduction in TiO[sub 2] passivated porosus silicon Schottky-barrier diode

✍ Scribed by Hwang, J. D.; Chou, C. H.


Book ID
121324912
Publisher
American Institute of Physics
Year
2010
Tongue
English
Weight
523 KB
Volume
96
Category
Article
ISSN
0003-6951

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