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On the optimization of the PIXE technique for thickness uniformity control of ultra-thin chromium layers deposited onto large surface quartz substrate

✍ Scribed by K. Zahraman; B. Nsouli; M. Roumié; J.P. Thomas; S. Danel


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
143 KB
Volume
249
Category
Article
ISSN
0168-583X

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