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On the mechanism of secondary ion formation from poly(methylmethacrylate) under static secondary ion mass spectrometry conditions

✍ Scribed by J. Lub; A. Benninghoven


Publisher
John Wiley and Sons
Year
1989
Tongue
English
Weight
409 KB
Volume
24
Category
Article
ISSN
1076-5174

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πŸ“œ SIMILAR VOLUMES


Secondary Ion Mass Spectrometric Studies
✍ S. Daolio; J. KristΓ³f; J. Mink; A. De Battisti; J. MihΓ‘ly; C. Piccirillo πŸ“‚ Article πŸ“… 1996 πŸ› John Wiley and Sons 🌐 English βš– 582 KB

Secondary ion mass spectrometry (SIMS) was used to analyse the formation mechanism of IrO,/ZrO, film electrodes. The coating mixtures with compositions 20% Ir+80% Zr and 50% Ir+50% Zr prepared on titanium supports from alcoholic solutions of IrCl3.3H2O and Zr0C1,.8H20 precursors were heated to speci