𝔖 Bobbio Scriptorium

✦ LIBER ✦

On the mechanism of hFE degradation by emitter-base reverse current stress

✍ Scribed by J.F. Verwey

Publisher: Elsevier Science
Year: 1970
Tongue: English
Weight: 548 KB
Volume: 9
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(70)90434-8

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

hFE shift on the reverse bias test for e

hFE shift on the reverse bias test for emitter-base junction : Tatsuya Tominago and Tetsuaki Wada. Proceedings of the 17th Symposium on Reliability and Maintainability, Union of Japanese Scientists and Engineers, 37 (2–4 June 1987)

📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 133 KB