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On the mechanism of annealing effect in electrical resistivity of sub-100 nm Ag (1% W) films

✍ Scribed by E. Glickman; A. Inberg; V. Bogush; G. Aviram; N. Croitoru; Y. Shacham-Diamand

Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 473 KB
Volume: 76
Category: Article
ISSN: 0167-9317
DOI: 10.1016/j.mee.2004.07.052

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