On the measurement of parasitic capacitances of device with more than two external terminals using an LCR meter

✍ Scribed by Lin, W.W.; Chan, P.C.

• Book ID: 114538941
• Publisher: IEEE
• Year: 1991
• Tongue: English
• Weight: 306 KB
• Volume: 38
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.97429