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On the investigation of electronic defect states in ZnO thin films by space charge spectroscopy with optical excitation

✍ Scribed by Matthias Schmidt; Holger von Wenckstern; Rainer Pickenhain; Marius Grundmann

Book ID: 116890884
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 544 KB
Volume: 75
Category: Article
ISSN: 0038-1101
DOI: 10.1016/j.sse.2012.04.043

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