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On the investigation of degradation mechanisms in ultrahigh performance GaAs heterojunction bipolar transistors

โœ Scribed by Chang, Y.-H.; Li, G.P.; Oki, A.K.; Streit, D.; Hafizi, M.E.; Kim, M.E.


Book ID
114534807
Publisher
IEEE
Year
1991
Tongue
English
Weight
148 KB
Volume
38
Category
Article
ISSN
0018-9383

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