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On the Invariance, Coincidence, and Statistical Equivalence of the GLRT, Rao Test, and Wald Test

โœ Scribed by De Maio, A.; Kay, S.M.; Farina, A.


Book ID
119823420
Publisher
IEEE
Year
2010
Tongue
English
Weight
479 KB
Volume
58
Category
Article
ISSN
1053-587X

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