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On the interpretation of kossel patterns

✍ Scribed by Crellin, E. B. ;Bevis, M.


Publisher
John Wiley and Sons
Year
1970
Tongue
English
Weight
142 KB
Volume
3
Category
Article
ISSN
0031-8965

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Diffraction techniques are widely used especially as additional tools for analytical microprobe analysis. A supplementary device to a scanning electron microscope (SEM) allows taking of X-ray lattice source and wide angle interference patterns, now termed Kossel and Pseudo Kossel patterns, respectiv