On the Evaporation Process of the Ge–Se–Tl System

✍ Scribed by Petkov, P. ;Vodenicharov, C. ;Kanasirski, C.

• Publisher: John Wiley and Sons
• Year: 1998
• Tongue: English
• Weight: 170 KB
• Volume: 168
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/(sici)1521-396x(199808)168:2<447::aid-pssa447>3.0.co;2-7

✦ Synopsis

The process of vacuum evaporation and condensation in the Ge±Se±Tl system is investigated. The kinetics of the processes are studied at evaporation temperatures from 560 to 905 K and substrate temperatures from 290 to 400 K. The evaporation energy as function of the thallium content at a constant ratio Ge/Se is in the range from 126 to 157 kJ/mol. The condensation energy is in the range from 5.99 to 7.03 kJ/mol. The electron microscope investigation provides information about the morphology of the films. The film composition has been investigated by Auger electron spectroscopy.