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On the effect of gate oxide thickness upon the hall mobility and other magneto-electrical characteristics in most structures : J. Kassabov, N. Velchev and V. Gancheva. Solid St. Electron.17, 41 (1974)


Publisher
Elsevier Science
Year
1974
Tongue
English
Weight
111 KB
Volume
13
Category
Article
ISSN
0026-2714

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