On the determination of the carrier concentration in large-grain polycrystalline InP, GaAs, and GaP by Hall effect measurements

✍ Scribed by Siegel, W. ;Kühnel, G. ;Schneider, H. A.

• Publisher: John Wiley and Sons
• Year: 1985
• Tongue: English
• Weight: 565 KB
• Volume: 87
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2210870232