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On the determination of carbon and oxygen impurities in silicon by3He activation analysis

✍ Scribed by A. Q. Sanni; N. G. Roché; H. J. Dowell; E. A. Schweikert; T. H. Ramsey


Book ID
112697519
Publisher
Springer
Year
1984
Tongue
English
Weight
216 KB
Volume
81
Category
Article
ISSN
1588-2780

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