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On the detection of large organic ions by secondary electron production

✍ Scribed by A. Hedin; P. H»kansson; B.U.R. Sundqvist


Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
906 KB
Volume
75
Category
Article
ISSN
0168-1176

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Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been used to analyse the surface composition of organic-inorganic hybrid solids obtained by a sol-gel process. Gels of type O 1.5 Si-R-SiO 1.5 , obtained from bis-silylated precursors (R'O) 3 -R-Si(OR') 3 (R' = Me, Et and R = (-CH 2 ) n -