On the destruction limit of Si power diodes during reverse recovery with dynamic avalanche

✍ Scribed by Domeij, M.; Lutz, J.; Silber, D.

• Book ID: 114616965
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 658 KB
• Volume: 50
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2002.808423