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On the design robustness of threshold logic gates using multi-input floating gate MOS transistors

✍ Scribed by Luck, A.; Jung, S.; Brederlow, R.; Thewes, R.; Goser, K.; Weber, W.


Book ID
114538183
Publisher
IEEE
Year
2000
Tongue
English
Weight
348 KB
Volume
47
Category
Article
ISSN
0018-9383

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