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On the design of improved failure detection experiments in synchronous sequential machines based on terminal measurements: S. R. Das, Z. Chen, S. M. Wu, S. Y. Lee and A. Bhattacharyya. Computer Elec Engng, 6, 293 (1979)


Publisher
Elsevier Science
Year
1980
Tongue
English
Weight
122 KB
Volume
20
Category
Article
ISSN
0026-2714

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