✦ LIBER ✦

On the dark-field image technique in the identification of very small particles in thin foils

✍ Scribed by Dr. J. Eysymontt; Dipl.- Ing. A. Schwedler

Publisher: John Wiley and Sons
Year: 1973
Tongue: English
Weight: 323 KB
Volume: 8
Category: Article
ISSN: 0232-1300
DOI: 10.1002/crat.19730081110

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✦ Synopsis

Abstract

The possibility of identification of very small particles of a second phase precipitation is reported which take such a small volume in the structure that it is impossible to get a visualable electron diffraction pattern from the selective diffraction technique. The evaluation of interplanar spacings and interplanar angles of crystallographic lattice of such particles is possible by the dark field image technique, if the orientation relationship between them and matrix is known „a priori”︁. The application of that method has been illustrated by examples of the identification of copper particles as well as those of carbo‐nitrides type MX in low alloy steels.

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