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On the calculation of the capacitance coefficients for VLSI multilevel metallization lines by using domain methods

โœ Scribed by Matzke, W.; Heinemann, B.; Telschow, G.


Book ID
114535058
Publisher
IEEE
Year
1989
Tongue
English
Weight
351 KB
Volume
36
Category
Article
ISSN
0018-9383

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