๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

On the analysis of accelerated life-testing experiments

โœ Scribed by Watkins, A.J.


Book ID
114555733
Publisher
IEEE
Year
1991
Tongue
English
Weight
340 KB
Volume
40
Category
Article
ISSN
0018-9529

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Multi-level accelerated life tests (ALTs), MEOST (multiple extreme overstress testing) and traditional step-stress approaches (hereafter all called simply step-stress) have a number of worthwhile applications for the analysis of the projected reliability of components and systems. These test methods