On the accurate measurement of oxygen self-diffusivities and surface exchange coefficients in oxides via SIMS depth profiling

✍ Scribed by P Fielitz; G Borchardt

• Book ID: 108409693
• Publisher: Elsevier Science
• Year: 2001
• Tongue: English
• Weight: 180 KB
• Volume: 144
• Category: Article
• ISSN: 0167-2738
• DOI: 10.1016/s0167-2738(01)00893-1