A new scheme of test data compression/decompression, namely coding of even bits marking and selective output inversion, is presented. It first uses a special kind of codewords, odd bits of which are used to represent the length of runs and even bits of which are used to represent whether the codewor
On Test Data Compression Using Selective Don’t-Care Identification
✍ Scribed by Terumine Hayashi; Haruna Yoshioka; Tsuyoshi Shinogi; Hidehiko Kita; Haruhiko Takase
- Publisher
- Springer
- Year
- 2005
- Tongue
- English
- Weight
- 669 KB
- Volume
- 20
- Category
- Article
- ISSN
- 1000-9000
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