## Abstract __c__βAxis oriented aluminum nitride (AlN) thin films are successfully prepared on amorphous polyimide films by radiofrequency magnetron reactive sputtering at room temperature. Structural analysis shows that the AlN films have a wurtzite structure and consist of __c__βaxis oriented col
β¦ LIBER β¦
On Stability of a Thin-Walled Shaft with Active Piezoelectric Fibers
β Scribed by P. Przybylowicz
- Publisher
- John Wiley and Sons
- Year
- 2002
- Weight
- 92 KB
- Volume
- 1
- Category
- Article
- ISSN
- 1617-7061
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