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On-resistance, thermal resistance and reverse recovery time of power MOSFETs at 77 K

โœ Scribed by O. Mueller


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
697 KB
Volume
29
Category
Article
ISSN
0011-2275

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โœฆ Synopsis


Measurements of the on-resistance, the approximate thermal resistance and the drain-source diode reverse recovery time of new commercially available power MOS field-effect transistors at room and at liquid nitrogen temperature (77 K) are presented and compared. It is demonstrated that all three parameters drastically improve in cooled devices, especially in those with high breakdown voltage.


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