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On reliability of a large consecutive-k-out-of-n:F system with (k-l)-step Markov dependence: James C. Fu and Beihua Hu. IEEE Trans. Reliab.R-36, 75 (1987)

Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 126 KB
Volume: 28
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(88)90060-1

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