On reducing test application time for scan circuits using limited scan operations and transfer sequences

✍ Scribed by Yonsang Cho; Pomeranz, I.; Reddy, S.M.

• Book ID: 117907412
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 292 KB
• Volume: 24
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/tcad.2005.852285