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On Projected Thick Sections of Stationary Point Processes and Boolean Models

✍ Scribed by Markus Kiderlen

Book ID
125064814
Publisher
Applied Probability Trust
Year
1996
Tongue
English
Weight
194 KB
Volume
28
Category
Article
ISSN
0001-8678

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## Abstract The paper presents a method for the second‐order analysis of point processes, and, basing on it, for their orientation analysis. For the reduced second moment measure of stationary and of stationary and isotropic point processes a new estimator is given, which has some advantages in com