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On Phonon Confinement Effects and Free Carrier Concentration in GaN Quantum Dots

โœ Scribed by M. Kuball; J. Gleize; Satoru Tanaka; Y. Aoyagi


Publisher
John Wiley and Sons
Year
2001
Tongue
English
Weight
368 KB
Volume
228
Category
Article
ISSN
0370-1972

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โœฆ Synopsis


Self-assembled GaN quantum dots (QDs) grown on Al 0.15 Ga 0.85 N using Si as anti-surfactant were investigated by resonant Raman scattering. Phonons of GaN QDs of different sizes were probed selectively by using laser excitation energies of 3.53 and 5.08 eV. Phonon confinement effects were evidenced in GaN QDs of 2-3 nm height. Resonant Raman scattering on GaN grown on Al 0.23 Ga 0.77 N after the deposition of an increasing amount of Si anti-surfactant, i.e., the morphological transition from a GaN quantum well (2D) to GaN quantum dots (0D), was also investigated.


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