On measurement and prediction of the solid fraction within mushy layers
β Scribed by A.O.P. Chiareli; M.Grae Worster
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 766 KB
- Volume
- 125
- Category
- Article
- ISSN
- 0022-0248
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
Measurement errors can have dramatic impact on the outcome of empirical analysis. In this article we quantify the eects that they can have on predictions generated from ARMA processes. Lower and upper bounds are derived for dierences in minimum mean squared prediction errors (MMSE) for forecasts gen
The effects of solids density and void fraction on the bubble rise velocity of distorted spherical and circular-cap bubbles in two-and three-dimensional liquid-solid fluidixed beds have been examined. Specific gravities of the solid phase ranged from 1.02 to 2.50, and the equivalent bubble diameter
For IR thickness measurements of very thin silicon epitaxial layers (dep, < 3 pm) on silicon substrate the influence of the concentration profile of free carriers in the whole system is not negligible. The effects of most important profile parameters on the IR reflectance spectrum of silicon epitaxi