𝔖 Bobbio Scriptorium
✦   LIBER   ✦

On measurement and prediction of the solid fraction within mushy layers

✍ Scribed by A.O.P. Chiareli; M.Grae Worster


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
766 KB
Volume
125
Category
Article
ISSN
0022-0248

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


The impact of measurement errors on ARMA
✍ Sergio G. Koreisha; Yue Fang πŸ“‚ Article πŸ“… 1999 πŸ› John Wiley and Sons 🌐 English βš– 174 KB πŸ‘ 2 views

Measurement errors can have dramatic impact on the outcome of empirical analysis. In this article we quantify the eects that they can have on predictions generated from ARMA processes. Lower and upper bounds are derived for dierences in minimum mean squared prediction errors (MMSE) for forecasts gen

The effects of solids density and void f
✍ Michael J. Bly; R.Mark Worden πŸ“‚ Article πŸ“… 1992 πŸ› Elsevier Science 🌐 English βš– 615 KB

The effects of solids density and void fraction on the bubble rise velocity of distorted spherical and circular-cap bubbles in two-and three-dimensional liquid-solid fluidixed beds have been examined. Specific gravities of the solid phase ranged from 1.02 to 2.50, and the equivalent bubble diameter

Influence of Profile Parameters on the I
✍ Dipl.-Ing. Ch. Quick; Dr. E. Hild; Dr.-Ing. P. Schley; Dr.-Ing. J. Quick πŸ“‚ Article πŸ“… 1991 πŸ› John Wiley and Sons 🌐 English βš– 323 KB πŸ‘ 2 views

For IR thickness measurements of very thin silicon epitaxial layers (dep, < 3 pm) on silicon substrate the influence of the concentration profile of free carriers in the whole system is not negligible. The effects of most important profile parameters on the IR reflectance spectrum of silicon epitaxi