On-Line Characterization of Submicron Particles from High Concentration Sources via Mobility Analysis

✍ Scribed by Matthias Katzer; Eberhard Schmidt; Gerhard Kasper

• Publisher: John Wiley and Sons
• Year: 1998
• Tongue: English
• Weight: 295 KB
• Volume: 21
• Category: Article
• ISSN: 0930-7516
• DOI: 10.1002/(sici)1521-4125(199803)21:3<253::aid-ceat253>3.0.co;2-0