✦ LIBER ✦
On-Chip Random Jitter Testing Using Low Tap-Count Coarse Delay Lines
✍ Scribed by Jiun-Lang Huang
- Publisher
- Springer US
- Year
- 2006
- Tongue
- English
- Weight
- 419 KB
- Volume
- 22
- Category
- Article
- ISSN
- 0923-8174
No coin nor oath required. For personal study only.