✦ LIBER ✦
On-chip measurement of package-related metal shift using an integrated silicon sensor : Andre Bossche. 27th a. Proc. IEEE/IRPS Int. Reliab. Phys. Symp., 127 (1989)
- Publisher
- Elsevier Science
- Year
- 1990
- Tongue
- English
- Weight
- 124 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.